Low Temperature Physics: 29, 353 (2003); https://doi.org/10.1063/1.1542480 (3 pages)
Fizika Nizkikh Temperatur: Volume 29, Number 4 (April 2003), p. 469-472    ( to contents , go back )

Electron diffraction study into root-mean-square atomic displacement in krypton free clusters

V.V. Eremenko, S.I. Kovalenko, and D.D. Solnyshkin

B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Science of Ukraine, 47 Lenin Ave., Kharkov, 61103, Ukraine
E-mail: verkhovtseva@ilt.kharkov.ua

Received October 3, 2002, revised November 4, 2002


The size dependence of the root-mean-square amplitude < u2 > 1/2 of atoms in krypton free clusters was first determined by electron diffraction. The mean size of the clusters N̅ formed in the supersonic krypton jets varied from 1×103 to 2×104 atoms/cluster. It is found that < u 2 > 1/2 increases with decreasing cluster size. The comparison between the dependence observed and that calculated with taking into account the contribution from the surface atoms showed that for clusters with N̅≥4×103 atoms/cluster, the increase in < u 2 > 1/2 with N̅ decreased was solely due to the increase in the relative number of the surface atoms. The correlation between the calculation and the experiment disappears at N̅≤4×103 atoms/cluster. In this case the experimental values are substantially higher than the calculated ones, suggesting that in small aggregations there are other factors, except the surface, which also contribute the increase in < u 2 > 1/2.

61.46+w -
81.10.Aj - Theory and models of crystal growth; physics of crystal growth, crystal morphology, and orientation

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