Thin film superconducting quantum interferometer with ultra-low inductance
S.I. Bondarenko1, A.V. Krevsun1, E.V. Ilichev2, U. Hubner2, V.P. Koverya1, and S.I. Link1
1B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine 47 Nauky Ave., Kharkiv 61103, Ukraine
2Leibniz Institute of Photonic Technology Albert-Einstein-Straße 9 (Beutenberg Campus), 07745 Jena, Germany
Received October 27, 2017
Simple manufacturing thin film superconducting quantum interferometer (SQI) with an ultra-low inductance (~ 10–13 H) has been developed. Current-voltage and voltage-field characteristics of SQI are presented. The main calculated ratios, confirmed by experiment, are obtained. The penetration depth of a magnetic field in an alloy film 50% In–50% Sn for the first time is defined by means of the SQI.
PACS: 74.50.+r Proximity effects, weak links, tunneling phenomena, Josephson effects; PACS: 74.25.F– Transport properties; PACS: 74.25.Ha Magnetic properties including vortex structures and related phenomena; PACS: 74.78.–w Superconducting films and low-dimensional structures.