Fizika Nizkikh Temperatur: Volume 46, Number 11 (November 2020), p. 1303-1309    ( to contents , go back )

Accumulation layers in cryogenic electrolytes

I. Chikina and V. Shikin

1Université Paris-Saclay, CEA, CNRS, NIMBE, Lions, 91191, Gif-sur-Yvette, France

1Institute of Solid State Physics RAS, 2 Academician Ossipyan Str., Chernogolovka 142432, Russia
E-mail: shikin@issp.ac.ru
pos Анотація:

Received May 25, 2020, published online September 21, 2020

Abstract

Flat cryogenic cells with a radiation source at one of the control (zero) electrodes create promising opportunities for studying the properties of charged accumulation layers in weakly conducting media. The question of the origin of different relaxation times, short τ0 or long τ >> τ0, when the environment is exposed to a rectangular surge of the control voltage Vg, remains topical in this area. The existing, mainly numerical, analysis of the problem confirms the existence of a hierarchy of relaxation times. But it ignores the physical nature of the observed dispersion. A “self-similar” version of the adaptation of the accumulation layer to its stationary state is discussed. Within the scenario, a clear definition of the concepts τ0 and τ >> τ0 arises. A relationship between τ and Vg is found. The pioneering significance of cryogenic data in the experimental study of the kinetics of accumulation layers is noted.

Key words: cryogenic electrolytes, flat cryogenic cells, accumulation layers.

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