Low Temperature Physics: 35, 335 (2009); https://doi.org/10.1063/1.3117964 (4 pages)
Fizika Nizkikh Temperatur: Volume 35, Number 4 (April 2009), p. 433-437    ( to contents , go back )

Electron traps in solid Xe

Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko

B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine 47 Lenin Ave., Kharkov 61103, Ukraine
E-mail: khyzhniy@gmail.com

Galina B. Gumenchuk, Alexey N. Ponomaryov, and Vladimir E. Bondybey

Lehrstuhl for Physicalische Chemie II TUM, 85747 Garching, Germany
pos Анотація:

Received December 12, 2008

Abstract

Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects was estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.

PACS: 78.60.Kn Thermoluminescence;
PACS: 79.75.+g Exoelectron emission.

Key words: rare gas solids, thermally stimulated luminescence, exoelectron emission, relaxation processes.

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